Automated sewer inspection using image processing and a neural classifier

O Duran (Contributor), K Althoefer (Contributor), L Seneviratne (Contributor)

    Research output: Contribution to conferencePaperpeer-review

    Original languageEnglish
    DOIs
    Publication statusPublished - 2002
    EventInternational Joint Conference in Neural Networks (IJCNN02) - Honolulu, Hawaii, USA
    Duration: 12 May 200217 May 2002

    Conference

    ConferenceInternational Joint Conference in Neural Networks (IJCNN02)
    Period12/05/0217/05/02

    Keywords

    • Electrical and electronic engineering

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