| Original language | English |
|---|---|
| DOIs | |
| Publication status | Published - 31 Jan 2021 |
| Event | The 20th International Conference on Electronics, Information, and Communication (ICEIC 2021) - Jeju, Korea (South) Duration: 31 Jan 2021 → 3 Feb 2021 |
Conference
| Conference | The 20th International Conference on Electronics, Information, and Communication (ICEIC 2021) |
|---|---|
| Period | 31/01/21 → 3/02/21 |
Bibliographical note
Note: Published in: 2021 International Conference on Electronics, Information, and Communication (ICEIC) : Piscataway, U.S. : Institute of Electrical and Electronics Engineers, Inc. pp. 1-4. ISBN: 9781728191614This research was supported by the Grand Information Technology Research Center Program through the Institute of Information and Communications Technology and Planning and Evaluation (IITP) funded by the Ministry of Science and ICT (MSIT), Korea [grant number: IITP-2020-2020-0-01612].
Organising Body: Institute of Electrical and Electronics Engineers , Institute of Electronics and Information Engineers
Keywords
- Computer science and informatics
Research output
- 1 Conference contribution
-
Detection of faults in solar panels using deep learning
Han, S. H., Rahim, T. & Shin, S. Y., 31 Jan 2021, Published in: 2021 International Conference on Electronics, Information, and Communication (ICEIC) : Piscataway, U.S. : Institute of Electrical and Electronics Engineers, Inc. pp. 1-4. ISBN: 9781728191614 This research was supported by the Grand Information Technology Research Center Program through the Institute of Information and Communications Technology and Planning and Evaluation (IITP) funded by the Ministry of Science and ICT (MSIT), Korea [grant number: IITP-2020-2020-0-01612]. Organising Body: Institute of Electrical and Electronics Engineers , Institute of Electronics and Information Engineers Organising Body: Institute of Electrical and Electronics Engineers , Institute of Electronics and Information Engineers. p. 1-4Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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