Detection of faults in solar panels using deep learning

    Research output: Contribution to conference › Paper › peer-review

    Original languageEnglish
    DOIs
    Publication statusPublished - 31 Jan 2021
    EventThe 20th International Conference on Electronics, Information, and Communication (ICEIC 2021) - Jeju, Korea (South)
    Duration: 31 Jan 2021 → 3 Feb 2021

    Conference

    ConferenceThe 20th International Conference on Electronics, Information, and Communication (ICEIC 2021)
    Period31/01/21 → 3/02/21

    Bibliographical note

    Note: Published in: 2021 International Conference on Electronics, Information, and Communication (ICEIC) : Piscataway, U.S. : Institute of Electrical and Electronics Engineers, Inc. pp. 1-4. ISBN: 9781728191614

    This research was supported by the Grand Information Technology Research Center Program through the Institute of Information and Communications Technology and Planning and Evaluation (IITP) funded by the Ministry of Science and ICT (MSIT), Korea [grant number: IITP-2020-2020-0-01612].

    Organising Body: Institute of Electrical and Electronics Engineers , Institute of Electronics and Information Engineers

    Keywords

    • Computer science and informatics

    Access to Document

    • 1 Conference contribution

    • Detection of faults in solar panels using deep learning

      Han, S. H., Rahim, T. & Shin, S. Y., 31 Jan 2021, Published in: 2021 International Conference on Electronics, Information, and Communication (ICEIC) : Piscataway, U.S. : Institute of Electrical and Electronics Engineers, Inc. pp. 1-4. ISBN: 9781728191614 This research was supported by the Grand Information Technology Research Center Program through the Institute of Information and Communications Technology and Planning and Evaluation (IITP) funded by the Ministry of Science and ICT (MSIT), Korea [grant number: IITP-2020-2020-0-01612]. Organising Body: Institute of Electrical and Electronics Engineers , Institute of Electronics and Information Engineers Organising Body: Institute of Electrical and Electronics Engineers , Institute of Electronics and Information Engineers. p. 1-4

      Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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