EC: a measurement based safer subset of ISO C suitable for embedded system development

Leslie Hatton

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	181-187
Journal	Information and Software Technology
Volume	47
Issue number	3
DOIs	https://doi.org/10.1016/j.infsof.2004.08.001
Publication status	Published - Mar 2005
Externally published	Yes

Keywords

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title = "EC: a measurement based safer subset of ISO C suitable for embedded system development",

keywords = "ISOC, embedded system, base subset, Computer science and informatics",

author = "Leslie Hatton",

year = "2005",

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language = "English",

volume = "47",

pages = "181--187",

journal = "Information and Software Technology",

issn = "0950-5849",

publisher = "Elsevier B.V.",

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}

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T2 - a measurement based safer subset of ISO C suitable for embedded system development

AU - Hatton, Leslie

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KW - embedded system

KW - base subset

KW - Computer science and informatics

U2 - 10.1016/j.infsof.2004.08.001

DO - 10.1016/j.infsof.2004.08.001

M3 - Article

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JO - Information and Software Technology

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