Event augmentation for contact force measurements

Fariborz Baghaei Naeini; Sanket Kachole; Dimitrios Makris; Yahya Zweiri

doi:10.1109/ACCESS.2022.3224584

Event augmentation for contact force measurements

Fariborz Baghaei Naeini, Sanket Kachole, Dimitrios Makris, Yahya Zweiri

Research output: Contribution to journal › Article › peer-review

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Original language	English
Pages (from-to)	123651-123660
Journal	IEEE Access
Volume	10
Early online date	24 Nov 2022
DOIs	https://doi.org/10.1109/ACCESS.2022.3224584
Publication status	Published - 2022

Bibliographical note

Note: This work is based upon work supported by Kingston University London, and the Khalifa University of Science and Technology under
Award No. RC1-2018-KUCARS.

Keywords

Computer science and informatics

Access to Document

10.1109/ACCESS.2022.3224584

Baghaei-Naeini-F-52796-VoRFinal published version, 8 MBLicence: CC BY

https://doi.org/10.1109/ACCESS.2022.3224584

Cite this

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title = "Event augmentation for contact force measurements",

keywords = "Computer science and informatics",

author = "Naeini, \{Fariborz Baghaei\} and Sanket Kachole and Dimitrios Makris and Yahya Zweiri",

note = "Note: This work is based upon work supported by Kingston University London, and the Khalifa University of Science and Technology under Award No. RC1-2018-KUCARS.",

year = "2022",

doi = "10.1109/ACCESS.2022.3224584",

language = "English",

volume = "10",

pages = "123651--123660",

journal = "IEEE Access",

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TY - JOUR

T1 - Event augmentation for contact force measurements

AU - Naeini, Fariborz Baghaei

AU - Kachole, Sanket

AU - Makris, Dimitrios

AU - Zweiri, Yahya

N1 - Note: This work is based upon work supported by Kingston University London, and the Khalifa University of Science and Technology under Award No. RC1-2018-KUCARS.

PY - 2022

Y1 - 2022

KW - Computer science and informatics

UR - https://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=6287639

U2 - 10.1109/ACCESS.2022.3224584

DO - 10.1109/ACCESS.2022.3224584

M3 - Article

SN - 2169-3536

VL - 10

SP - 123651

EP - 123660

JO - IEEE Access

JF - IEEE Access

ER -

Event augmentation for contact force measurements

Bibliographical note

Keywords

Access to Document

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Cite this