Failure Patterns: a powerful way to optimize your testing

  • L. Hatton

Research output: Contribution to conferenceLecture / Speechpeer-review

Original languageEnglish
Publication statusPublished - May 2007
Externally publishedYes
EventStarEast 2007 - Orlando, Florida
Duration: 14 May 200718 May 2007

Conference

ConferenceStarEast 2007
Period14/05/0718/05/07

Keywords

  • Computer science and informatics

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