Generalized ellipsometry and dielectric tensor of rubrene single crystals

  • S. Tavazzi
  • , L. Silvestri
  • , M. Campione
  • , A. Borghesi
  • , A. Papagni
  • , P. Spearman
  • , A. Yassar
  • , A. Camposeo
  • , D. Pisignano

    Research output: Contribution to journalArticlepeer-review

    Original languageEnglish
    Article number023107
    JournalJournal of Applied Physics
    Volume102
    Issue number2
    DOIs
    Publication statusPublished - 15 Jul 2007

    Bibliographical note

    Note: Article ID: 023107

    Keywords

    • spectroscopic ellipsometry
    • layer
    • transport
    • emission
    • Chemistry

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