Generalized ellipsometry and dielectric tensor of rubrene single crystals

S. Tavazzi; L. Silvestri; M. Campione; A. Borghesi; A. Papagni; P. Spearman; A. Yassar; A. Camposeo; D. Pisignano

doi:10.1063/1.2759188

Generalized ellipsometry and dielectric tensor of rubrene single crystals

S. Tavazzi, L. Silvestri, M. Campione, A. Borghesi, A. Papagni, P. Spearman, A. Yassar, A. Camposeo, D. Pisignano

Research output: Contribution to journal › Article › peer-review

Original language	English
Article number	023107
Journal	Journal of Applied Physics
Volume	102
Issue number	2
DOIs	https://doi.org/10.1063/1.2759188
Publication status	Published - 15 Jul 2007

Bibliographical note

Note: Article ID: 023107

Keywords

spectroscopic ellipsometry
layer
transport
emission
Chemistry

Access to Document

10.1063/1.2759188

http://dx.doi.org/10.1063/1.2759188

Cite this

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title = "Generalized ellipsometry and dielectric tensor of rubrene single crystals",

keywords = "spectroscopic ellipsometry, layer, transport, emission, Chemistry",

author = "S. Tavazzi and L. Silvestri and M. Campione and A. Borghesi and A. Papagni and P. Spearman and A. Yassar and A. Camposeo and D. Pisignano",

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AU - Tavazzi, S.

AU - Silvestri, L.

AU - Campione, M.

AU - Borghesi, A.

AU - Papagni, A.

AU - Spearman, P.

AU - Yassar, A.

AU - Camposeo, A.

AU - Pisignano, D.

N1 - Note: Article ID: 023107

PY - 2007/7/15

Y1 - 2007/7/15

KW - spectroscopic ellipsometry

KW - layer

KW - transport

KW - emission

KW - Chemistry

U2 - 10.1063/1.2759188

DO - 10.1063/1.2759188

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SN - 0021-8979

VL - 102

JO - Journal of Applied Physics

JF - Journal of Applied Physics

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M1 - 023107

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