Integral line scan features for pedestrian detection

B. Boghossian, S. Pedagadi, J. Orwell

    Research output: Contribution to conferencePaperpeer-review

    Original languageEnglish
    DOIs
    Publication statusPublished - Aug 2014
    Event22nd International Conference on Pattern Recognition - Stockholm, Sweden
    Duration: 24 Aug 201428 Aug 2014

    Conference

    Conference22nd International Conference on Pattern Recognition
    Period24/08/1428/08/14

    Bibliographical note

    Organising Body: IEEE

    Keywords

    • Computer science and informatics

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