Measurement, modeling and simulation of photovoltaic degradation rates

Mohamed Shaik Honnurvali; Naren Gupta; Keng Goh; Tariq Umar

doi:10.1007/978-981-15-4775-1_7

Measurement, modeling and simulation of photovoltaic degradation rates

Mohamed Shaik Honnurvali, Naren Gupta, Keng Goh, Tariq Umar

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Photovoltaic degradation rates play a vital role in visualizing and analyzing the performance of the PV modules over the long run. A site survey is conducted to calculate PV degradation rates. The results have shown that for the first three years since the initial installation, the degradation rates have remained in line with the manufacturer values (i.e., less than 0.6%), while the next two years the degradation rates have almost increased by 40%. This is due to discoloration of the encapsulant causing the reduction of the short circuit current (Isc). Mathematically, modeling such visual loss factors has not considered so far. The visual loss factor equation is developed and incorporated in the output current equation of the PV module. Further, the I-V curves are simulated and compared with the measured I-V curves. The results have shown an acceptable error percentage of around 0.3%.

Original language	English
Title of host publication	Published as: Honnurvali M.S., Gupta N., Goh K., umar T. (2020) Measurement, Modeling and Simulation of Photovoltaic Degradation Rates. In: Goel N., Hasan S., Kalaichelvi V. (eds) Modelling, Simulation and Intelligent Computing. MoSICom 2020. Lecture Notes in Electrical Engineering, vol 659. Springer, Singapore. ISBN: 9789811547744 ISSN: 1876-1100 (print) ISSN: 1876-1119 (electronic)
DOIs	https://doi.org/10.1007/978-981-15-4775-1_7
Publication status	Published - Jan 2020

Bibliographical note

Note: Published as: Honnurvali M.S., Gupta N., Goh K., umar T. (2020) Measurement, Modeling and Simulation of Photovoltaic Degradation Rates. In: Goel N., Hasan S., Kalaichelvi V. (eds) Modelling, Simulation and Intelligent Computing. MoSICom 2020. Lecture Notes in Electrical Engineering, vol 659. Springer, Singapore. ISBN: 9789811547744 ISSN: 1876-1100 (print) ISSN: 1876-1119 (electronic)

Keywords

Architecture and the built environment
PV (Photovoltaics)
STC (Standard test Conditions)
Short circuit current (Isc)

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10.1007/978-981-15-4775-1_7

Umar-T-48255-AAMAccepted author manuscript, 556 KBLicence: Unspecified

https://doi.org/10.1007/978-981-15-4775-1_7

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Measurement, modeling and simulation of photovoltaic degradation rates
Honnurvali, M. S., Gupta, N., Goh, K. & Umar, T., Jan 2020.
Research output: Contribution to conference › Paper › peer-review

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Honnurvali, M. S., Gupta, N., Goh, K., & Umar, T. (2020). Measurement, modeling and simulation of photovoltaic degradation rates. In Published as: Honnurvali M.S., Gupta N., Goh K., umar T. (2020) Measurement, Modeling and Simulation of Photovoltaic Degradation Rates. In: Goel N., Hasan S., Kalaichelvi V. (eds) Modelling, Simulation and Intelligent Computing. MoSICom 2020. Lecture Notes in Electrical Engineering, vol 659. Springer, Singapore. ISBN: 9789811547744 ISSN: 1876-1100 (print) ISSN: 1876-1119 (electronic) https://doi.org/10.1007/978-981-15-4775-1_7

Honnurvali, Mohamed Shaik ; Gupta, Naren ; Goh, Keng et al. / Measurement, modeling and simulation of photovoltaic degradation rates. Published as: Honnurvali M.S., Gupta N., Goh K., umar T. (2020) Measurement, Modeling and Simulation of Photovoltaic Degradation Rates. In: Goel N., Hasan S., Kalaichelvi V. (eds) Modelling, Simulation and Intelligent Computing. MoSICom 2020. Lecture Notes in Electrical Engineering, vol 659. Springer, Singapore. ISBN: 9789811547744 ISSN: 1876-1100 (print) ISSN: 1876-1119 (electronic). 2020.

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title = "Measurement, modeling and simulation of photovoltaic degradation rates",

abstract = "Photovoltaic degradation rates play a vital role in visualizing and analyzing the performance of the PV modules over the long run. A site survey is conducted to calculate PV degradation rates. The results have shown that for the first three years since the initial installation, the degradation rates have remained in line with the manufacturer values (i.e., less than 0.6\%), while the next two years the degradation rates have almost increased by 40\%. This is due to discoloration of the encapsulant causing the reduction of the short circuit current (Isc). Mathematically, modeling such visual loss factors has not considered so far. The visual loss factor equation is developed and incorporated in the output current equation of the PV module. Further, the I-V curves are simulated and compared with the measured I-V curves. The results have shown an acceptable error percentage of around 0.3\%.",

keywords = "Architecture and the built environment, PV (Photovoltaics), STC (Standard test Conditions), Short circuit current (Isc)",

author = "Honnurvali, \{Mohamed Shaik\} and Naren Gupta and Keng Goh and Tariq Umar",

note = "Note: Published as: Honnurvali M.S., Gupta N., Goh K., umar T. (2020) Measurement, Modeling and Simulation of Photovoltaic Degradation Rates. In: Goel N., Hasan S., Kalaichelvi V. (eds) Modelling, Simulation and Intelligent Computing. MoSICom 2020. Lecture Notes in Electrical Engineering, vol 659. Springer, Singapore. ISBN: 9789811547744 ISSN: 1876-1100 (print) ISSN: 1876-1119 (electronic)",

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booktitle = "Published as: Honnurvali M.S., Gupta N., Goh K., umar T. (2020) Measurement, Modeling and Simulation of Photovoltaic Degradation Rates. In: Goel N., Hasan S., Kalaichelvi V. (eds) Modelling, Simulation and Intelligent Computing. MoSICom 2020. Lecture Notes in Electrical Engineering, vol 659. Springer, Singapore. ISBN: 9789811547744 ISSN: 1876-1100 (print) ISSN: 1876-1119 (electronic)",

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Honnurvali, MS, Gupta, N, Goh, K & Umar, T 2020, Measurement, modeling and simulation of photovoltaic degradation rates. in Published as: Honnurvali M.S., Gupta N., Goh K., umar T. (2020) Measurement, Modeling and Simulation of Photovoltaic Degradation Rates. In: Goel N., Hasan S., Kalaichelvi V. (eds) Modelling, Simulation and Intelligent Computing. MoSICom 2020. Lecture Notes in Electrical Engineering, vol 659. Springer, Singapore. ISBN: 9789811547744 ISSN: 1876-1100 (print) ISSN: 1876-1119 (electronic). https://doi.org/10.1007/978-981-15-4775-1_7

Measurement, modeling and simulation of photovoltaic degradation rates. / Honnurvali, Mohamed Shaik; Gupta, Naren; Goh, Keng et al.
Published as: Honnurvali M.S., Gupta N., Goh K., umar T. (2020) Measurement, Modeling and Simulation of Photovoltaic Degradation Rates. In: Goel N., Hasan S., Kalaichelvi V. (eds) Modelling, Simulation and Intelligent Computing. MoSICom 2020. Lecture Notes in Electrical Engineering, vol 659. Springer, Singapore. ISBN: 9789811547744 ISSN: 1876-1100 (print) ISSN: 1876-1119 (electronic). 2020.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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T1 - Measurement, modeling and simulation of photovoltaic degradation rates

AU - Honnurvali, Mohamed Shaik

AU - Gupta, Naren

AU - Goh, Keng

AU - Umar, Tariq

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N2 - Photovoltaic degradation rates play a vital role in visualizing and analyzing the performance of the PV modules over the long run. A site survey is conducted to calculate PV degradation rates. The results have shown that for the first three years since the initial installation, the degradation rates have remained in line with the manufacturer values (i.e., less than 0.6%), while the next two years the degradation rates have almost increased by 40%. This is due to discoloration of the encapsulant causing the reduction of the short circuit current (Isc). Mathematically, modeling such visual loss factors has not considered so far. The visual loss factor equation is developed and incorporated in the output current equation of the PV module. Further, the I-V curves are simulated and compared with the measured I-V curves. The results have shown an acceptable error percentage of around 0.3%.

AB - Photovoltaic degradation rates play a vital role in visualizing and analyzing the performance of the PV modules over the long run. A site survey is conducted to calculate PV degradation rates. The results have shown that for the first three years since the initial installation, the degradation rates have remained in line with the manufacturer values (i.e., less than 0.6%), while the next two years the degradation rates have almost increased by 40%. This is due to discoloration of the encapsulant causing the reduction of the short circuit current (Isc). Mathematically, modeling such visual loss factors has not considered so far. The visual loss factor equation is developed and incorporated in the output current equation of the PV module. Further, the I-V curves are simulated and compared with the measured I-V curves. The results have shown an acceptable error percentage of around 0.3%.

KW - Architecture and the built environment

KW - PV (Photovoltaics)

KW - STC (Standard test Conditions)

KW - Short circuit current (Isc)

U2 - 10.1007/978-981-15-4775-1_7

DO - 10.1007/978-981-15-4775-1_7

M3 - Conference contribution

BT - Published as: Honnurvali M.S., Gupta N., Goh K., umar T. (2020) Measurement, Modeling and Simulation of Photovoltaic Degradation Rates. In: Goel N., Hasan S., Kalaichelvi V. (eds) Modelling, Simulation and Intelligent Computing. MoSICom 2020. Lecture Notes in Electrical Engineering, vol 659. Springer, Singapore. ISBN: 9789811547744 ISSN: 1876-1100 (print) ISSN: 1876-1119 (electronic)

ER -

Honnurvali MS, Gupta N, Goh K, Umar T. Measurement, modeling and simulation of photovoltaic degradation rates. In Published as: Honnurvali M.S., Gupta N., Goh K., umar T. (2020) Measurement, Modeling and Simulation of Photovoltaic Degradation Rates. In: Goel N., Hasan S., Kalaichelvi V. (eds) Modelling, Simulation and Intelligent Computing. MoSICom 2020. Lecture Notes in Electrical Engineering, vol 659. Springer, Singapore. ISBN: 9789811547744 ISSN: 1876-1100 (print) ISSN: 1876-1119 (electronic). 2020 doi: 10.1007/978-981-15-4775-1_7

Measurement, modeling and simulation of photovoltaic degradation rates

Abstract

Bibliographical note

Keywords

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Research output

Measurement, modeling and simulation of photovoltaic degradation rates

Cite this