Abstract
Photovoltaic degradation rates play a vital role in visualizing and analyzing the performance of the PV modules over the long run. A site survey is conducted to calculate PV degradation rates. The results have shown that for the first three years since the initial installation, the degradation rates have remained in line with the manufacturer values (i.e., less than 0.6%), while the next two years the degradation rates have almost increased by 40%. This is due to discoloration of the encapsulant causing the reduction of the short circuit current (Isc). Mathematically, modeling such visual loss factors has not considered so far. The visual loss factor equation is developed and incorporated in the output current equation of the PV module. Further, the I-V curves are simulated and compared with the measured I-V curves. The results have shown an acceptable error percentage of around 0.3%.
| Original language | English |
|---|---|
| Title of host publication | Published as: Honnurvali M.S., Gupta N., Goh K., umar T. (2020) Measurement, Modeling and Simulation of Photovoltaic Degradation Rates. In: Goel N., Hasan S., Kalaichelvi V. (eds) Modelling, Simulation and Intelligent Computing. MoSICom 2020. Lecture Notes in Electrical Engineering, vol 659. Springer, Singapore. ISBN: 9789811547744 ISSN: 1876-1100 (print) ISSN: 1876-1119 (electronic) |
| DOIs | |
| Publication status | Published - Jan 2020 |
Bibliographical note
Note: Published as: Honnurvali M.S., Gupta N., Goh K., umar T. (2020) Measurement, Modeling and Simulation of Photovoltaic Degradation Rates. In: Goel N., Hasan S., Kalaichelvi V. (eds) Modelling, Simulation and Intelligent Computing. MoSICom 2020. Lecture Notes in Electrical Engineering, vol 659. Springer, Singapore. ISBN: 9789811547744 ISSN: 1876-1100 (print) ISSN: 1876-1119 (electronic)Keywords
- Architecture and the built environment
- PV (Photovoltaics)
- STC (Standard test Conditions)
- Short circuit current (Isc)
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Measurement, modeling and simulation of photovoltaic degradation rates
Honnurvali, M. S., Gupta, N., Goh, K. & Umar, T., Jan 2020.Research output: Contribution to conference › Paper › peer-review
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