| Original language | English |
|---|---|
| Qualification | Doctor of Philosophy (PhD) |
| Awarding Institution |
|
| Publication status | Accepted/In press - 1996 |
Bibliographical note
Department: Department of PhysicsPhysical Location: This item is held in stock at Kingston University library.
Keywords
- microscopy
- semiconductor surfaces
- optics measurement
- Computer science and informatics
PhD type
- Standard route