On the practical applications of objective quality metrics for stereoscopic 3D imaging

Sria Biswas; Balasubramanyam Appina; Roopak R. Tamboli; Peter A. Kara; Aniko Simon

doi:10.1117/12.2597649

On the practical applications of objective quality metrics for stereoscopic 3D imaging

Sria Biswas
, Balasubramanyam Appina
, Roopak R. Tamboli
, Peter A. Kara
, Aniko Simon

Research output: Contribution to conference › Paper › peer-review

Original language	English
DOIs	https://doi.org/10.1117/12.2597649
Publication status	Published - 1 Aug 2021
Externally published	Yes
Event	SPIE Optical Engineering + Applications 2021 - San Diego, California, U.S. Duration: 1 Aug 2021 → 5 Aug 2021

Conference

Conference	SPIE Optical Engineering + Applications 2021
Period	1/08/21 → 5/08/21

Bibliographical note

Note: Published in: Applications of Machine Learning 2021, edited by Michael E. Zelinski, Tarek M. Taha, Jonathan Howe, Proc. of SPIE 11843, 118430E, ISSN 0277-786X

Organising Body: SPIE

Keywords

Computer science and informatics

Access to Document

10.1117/12.2597649

Kara-P-50363-AAMAccepted author manuscript, 258 KBLicence: Unspecified

https://doi.org/10.1117/12.2597649

1 Conference contribution

On the practical applications of objective quality metrics for stereoscopic 3D imaging
Biswas, S., Appina, B., Tamboli, R. R., Kara, P. A. & Simon, A., 1 Aug 2021, Published in: Applications of Machine Learning 2021, edited by Michael E. Zelinski, Tarek M. Taha, Jonathan Howe, Proc. of SPIE 11843, 118430E, ISSN 0277-786X Organising Body: SPIE Organising Body: SPIE. p. 16
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Open Access
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Cite this

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AU - Appina, Balasubramanyam

AU - Tamboli, Roopak R.

AU - Kara, Peter A.

AU - Simon, Aniko

N1 - Note: Published in: Applications of Machine Learning 2021, edited by Michael E. Zelinski, Tarek M. Taha, Jonathan Howe, Proc. of SPIE 11843, 118430E, ISSN 0277-786X Organising Body: SPIE

PY - 2021/8/1

Y1 - 2021/8/1

KW - Computer science and informatics

U2 - 10.1117/12.2597649

DO - 10.1117/12.2597649

M3 - Paper

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