Surface roughness evaluation

  • J. D. Briers

Research output: Chapter in Book/Report/Conference proceedingChapterpeer-review

Original languageEnglish
Title of host publicationSpeckle metrology
EditorsRajpal S. Sirohi
Place of PublicationNew York, U.S.
PublisherMarcel Dekker
Pages373-426
ISBN (Print)0824789326
Publication statusPublished - 1993
Externally publishedYes

Publication series

NameOptical engineering
PublisherMarcel Dekker
Number38

Keywords

  • Physics

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